Integrated x-ray sources application in analysis

HVONIK integrated ray source has the characteristics of stability and high energy, which can excite atoms in the sample to emit characteristic fluorescent X-rays. By combining the X-ray source with other analytical techniques such as X-ray diffraction (XRD) or X-ray fluorescence (XRF), comprehensive characteristics of the material can be obtained, including its elemental composition, crystal structure and phase composition. Each technology has its own unique advantages and scope of application, and combined use can provide more complete and detailed material analysis results. And it has the advantages of non-destructive analysis, high sensitivity and accuracy, simultaneous detection of multiple elements, rapid analysis, quantitative analysis, etc., which can not only perform phase analysis, but also stress analysis, texture analysis, thin film analysis, etc. It is widely used in geology, environmental science, materials science and industrial testing. Help researchers quantitatively analyze the elemental composition of various materials, as well as analyze the crystal structure and phase composition of samples. Not only that, we can also support element distribution mapping of large-area samples and generate two-dimensional or three-dimensional element distribution maps. This is very helpful in geology, materials science, archaeology and other fields.

Model: HVC301A0 / HVP5040A0